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冲成股份有限公司
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Exhibitions

展覽資訊

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  • 09.09

    SEMICON Taiwan 2026 圓滿落幕

  • 08.12

    冲成誠摯邀請您蒞臨 國際半導體展｜SEMICON Taiwan 2026

Products

冲成連結全球技術 驅動產業未來

  • AST-IR Workstation

    AST-IR Workstation

    NIR/SWIR Metrology & Inspection Workstation

  • AST-MEMS Workstation

    AST-MEMS Workstation

    MEMS Inspection Workstation

  • RCplus

    RCplus

    G&N

  • AST-CDO

    AST-CDO

    CD & Overlay Metrology System

  • AST-IR Workstation

    AST-IR Workstation

    NIR/SWIR Metrology & Inspection Workstation

  • AST-Zentura

    AST-Zentura

    Zentura Wafer-Level Metrology System

  • D-Surface View

    D-Surface View

    DipView

  • MX 203-6-41-q

    MX 203-6-41-q

    E+H

  • MPS R400 CV

    MPS R400 CV

    G&N

  • AST-CDO

    AST-CDO

    CD & Overlay Metrology System

  • AST-WDI

    AST-WDI

    Wafer & Die Inspection System

  • E200 Eco

    E200 Eco

    G&N

  • AST-IR Automated

    AST-IR Automated

    Automated NIR/SWIR Metrology & Inspection System

  • AST-WDI

    AST-WDI

    Wafer & Die Inspection System

  • AST-MEMS Workstation

    AST-MEMS Workstation

    MEMS Inspection Workstation

  • AST-WDI

    AST-WDI

    Wafer & Die Inspection System

  • Crystal Slip Defect Detection (SlipFinder)

    Crystal Slip Defect Detection (SlipFinder)

    Hologenix

  • Global Nanoscope

    Global Nanoscope

    E+H

  • AST-CDO

    AST-CDO

    CD & Overlay Metrology System

  • MX 301-AC

    MX 301-AC

    E+H

  • AST-MWIR Workstation

    AST-MWIR Workstation

    Mid-Wave Infrared Inspection & Analysis System

  • AST-VCSEL

    AST-VCSEL

    VCSEL Optical Aperture Metrology System

  • AST-WDI

    AST-WDI

    Wafer & Die Inspection System

  • Defect Detection on Ultra-Flat Wafers (Magic Mirror™)

    Defect Detection on Ultra-Flat Wafers (Magic Mirror™)

    Hologenix

  • AST-Zentura

    AST-Zentura

    Zentura Wafer-Level Metrology System

  • T501 evo

    T501 evo

    G&N

  • AST-IR Workstation

    AST-IR Workstation

    NIR/SWIR Metrology & Inspection Workstation

  • AST-MWIR Benchtop

    AST-MWIR Benchtop

    Mid-Wave Infrared Inspection & Analysis Benchtop S

  • MPS R400 CV TWIN

    MPS R400 CV TWIN

    G&N

  • AST-CDO

    AST-CDO

    CD & Overlay Metrology System

  • AST-IR Workstation

    AST-IR Workstation

    NIR/SWIR Metrology & Inspection Workstation

  • MPS 2 R300 CV

    MPS 2 R300 CV

    G&N

  • MX 1012

    MX 1012

    E+H

  • AST-WDI

    AST-WDI

    Wafer & Die Inspection System

  • AST-IR Workstation

    AST-IR Workstation

    NIR/SWIR Metrology & Inspection Workstation

  • AST-CDO

    AST-CDO

    CD & Overlay Metrology System

  • AST-IR Workstation

    AST-IR Workstation

    NIR/SWIR Metrology & Inspection Workstation

  • Waferstudio

    Waferstudio

    E+H

  • AST-IR Automated

    AST-IR Automated

    Automated NIR/SWIR Metrology & Inspection System

  • AST-MEMS Automated

    AST-MEMS Automated

    Automated MEMS Inspection System

  • AST-IR Automated

    AST-IR Automated

    Automated NIR/SWIR Metrology & Inspection System

  • MX 3012-AC

    MX 3012-AC

    E+H

  • AST-CDO

    AST-CDO

    CD & Overlay Metrology System

  • AST-Zentura

    AST-Zentura

    Zentura Wafer-Level Metrology System

  • AST-IR Automated

    AST-IR Automated

    Automated NIR/SWIR Metrology & Inspection System

  • MX 1018

    MX 1018

    E+H

  • AST-IR Automated

    AST-IR Automated

    Automated NIR/SWIR Metrology & Inspection System

  • Robot Sorters

    Robot Sorters

    E+H

  • MX 152/153

    MX 152/153

    E+H

  • AST-CDO

    AST-CDO

    CD & Overlay Metrology System

  • AST-IR Automated

    AST-IR Automated

    Automated NIR/SWIR Metrology & Inspection System

  • AST-IR Workstation

    AST-IR Workstation

    NIR/SWIR Metrology & Inspection Workstation

  • Belt Sorters

    Belt Sorters

    E+H

  • AST-IR Automated

    AST-IR Automated

    Automated NIR/SWIR Metrology & Inspection System

  • VISION 200/300-M

    VISION 200/300-M

    DipView

  • AST-WDI

    AST-WDI

    Wafer & Die Inspection System

  • AST-CDO

    AST-CDO

    CD & Overlay Metrology System

  • AST-MEMS Automated

    AST-MEMS Automated

    Automated MEMS Inspection System

  • AST-MWIR Workstation

    AST-MWIR Workstation

    Mid-Wave Infrared Inspection & Analysis System

  • AST-VCSEL

    AST-VCSEL

    VCSEL Optical Aperture Metrology System

  • AST-WDI

    AST-WDI

    Wafer & Die Inspection System

  • MX 204-8-49-q

    MX 204-8-49-q

    E+H

  • MX 604-ST

    MX 604-ST

    E+H

  • MX 152/153

    MX 152/153

    E+H

  • AST-MWIR Benchtop

    AST-MWIR Benchtop

    Mid-Wave Infrared Inspection & Analysis Benchtop S

  • ECO 500

    ECO 500

    G&N

  • AST-WDI

    AST-WDI

    Wafer & Die Inspection System

ABOUT JC's Chunson

ABOUT JC's Chunson

引領高科技未來，成就產業新高峰

冲成股份有限公司成立於1996年，是專業的半導體、太陽能及LED儀器設備代理商，致力於引進國外先進的製造設備與檢測儀器，並負責國內的銷售、安裝與技術支援，為客戶提供專業且全方位的服務。
為協助國內IC、LED、半導體與太陽能產業提升製造設備的專業水準與檢測精度，本公司代理來自歐美各國的知名設備製造商，提供業界最先進、最精密的設備與技術。
透過這些尖端技術的引進，我們致力於深化國內高科技產業的基礎，推動其穩健發展，助力產業邁向更高的國際競爭力。

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