Hologenix
NGS 3500L – Advanced Metrology System
APPLICATIONS
。Wafer level defect detection & measurement
。Precision MEMS and HD component inspection
。Advanced microelectronics package inspection
POWERFUL
。Designed for automatic/ semi-automatic operation
。Extensive Defect Detection features & capability
。Integrated Dimensional Metrology features
PRECISE
。Sub-micron precision optical measurements
。High accuracy staging with 0.02 um linear encoder resolution
FAST
。50-100 defects/ measurements per second typical per field of view
。200mm/ second part staging speed
USER FRIENDLY
。Very easy to use, program and set up
。Highly visual data with rich color graphics & Video
FLEXIBLE
。Nomarski Microscope and other advanced options
。Optional Wafer and other part types handling
。Customizable for application specific solutions
NGS 3500L – Advanced Metrology System
。 200mm (optional 300mm) wafer/ part size capacity
。 Maximum stage Load capacity: 50 lb
。 250mm/ second maximum staging speed
。 Granite base and Z-column, stainless steel finish
。 Class 100 (10 optional) clean room compatible
。 Closed loop linear stages, with position feedback from 0.05 um resolution linear glass encoders
。 Non-linear 2D accuracy error correction
。 Accuracy U2 (XY): 1.5+0.6L/100 um, U1 (Z): 1.5+3L/100 um. Where L is length in mm
。 Computer: Windows High Performance PC
。 Platform:High Performance 3000L
。 Software: NGS 3500L Advanced Metrology Suite
。 Optical System: Flat Field objectives, with optional motorized 5 position turret
。 Camera: High resolution CCD array 60+db S/N ratio
。 Image Processing 256 grayscale with 1:5-1:50 subpixel ratio. Optional 5 MP Color or 5MP Grayscale
。 Video and optional Laser Auto focus
。 Illumination: software controlled Coaxial & backlight
。 Environmental: 17-23 deg C, 20-80% Humidity
。 Electrical 120/240 VAC, 15A single phase
。 Footprint: WxD: 32x36 inch. Height: 67 inches
。 Weight: 1500 lb crated
NGS 3500L – Advanced Metrology System
。 Automatic defect detection and classification
。 Graphical Defect maps, Image Archival, offline review of defects, and reprocessing of archived images
。 Flexible part scanning for operator convenience and throughput optimization
。 High Precision vision based part alignment
。 Dimensional Metrology Tools:
Video Tools: Point, Line, Circle, Arc edge detectors with built in best fit and defect removal
Constructions: Extensive geometric constructions, with distance and angle measurements (e.g. line to line, etc.)
Origin & Skew: Unlimited reference frames
Tolerancing: Dimensional, Angular, Geometric True Position (MMC, LMC, RFS)
Units: Metric & inches
Coordinates: Cartesian & Polar
Step & Repeat: Repeat Loops for repeating features and multiple parts
Reports: Data on screen, text file, or exports to Excel
SPC: Average, SD, Range, Min, Max, Cp, Cpk
Graphics & CAD: Drawing import/ Export
Other: Auto Focus, Auto Lighting & Outlier Removal
Automatic Defect Detection & Classification
Automated Die Inspection
Precision Dimensional Metrology
Critical Dimension (CD) and Overlay Metrology Automatic and Manual Operation