冲成股份有限公司 JC's Chunson Limited
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MX 203-6-41-q

MX 203-6-41-q

E+H

High throughput: the MX203-6-41-q gauges with its 41 measuring points every wafer within max. 8 seconds. It controls thickness, bow and warp. Flexible wafer size adjustment by various centering-frames. Comes with our powerful MX-NT operating Software.
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Fast contactless geometry gauge for 100–156mm solar wafers.

Measurement type
。Thickness
。Flatness (TTV)
。Bow
。Warp
。Sori