冲成股份有限公司 JC's Chunson Limited
MX 204-48-37

MX 204-48-37

E+H

The MX204-48-37 works as manually loaded stand-alone tool as well as fully integrated in automated robot systems. With its 37 measuring points it controls thickness, bow and warp in high resolution. Wafer stress evaluation is optionally available. Different wafer sizes can be used without changeover thanks to the upstream centering station. Comes with our powerful MX-NT operating software.

Automatable geometry gauge for 100, 150 and 200mm silicon wafers.

Measurement type
。Thickness

。Flatness (TTV)

。Bow 

。Warp

Wafer Diameter 100mm, 150mm, 200mm
Thickness Accuracy ±0.5 µm
Resolution 75nm
Thickness range 400 - 900 µm
Automatic wafer geometry gauge yes
Software MXNT