冲成股份有限公司 JC's Chunson Limited
MX 2013

MX 2013

E+H

The MX2013 works as semi-automated stand-alone station. With its 37 measuring points it gauges 300mm wafers within 50 seconds. It controls thickness, bow and warp in high resolution (Corresponds with Sori). System optional available for 200mm wafer measuring. Comes with our powerful MX-NT operating Software.

Automatable geometry gauge for thin and standard 200mm or 300mm silicon wafers.

Measurement type
。Thickness

。Flatness (TTV)

。Bow 

。Warp

Wafer Diameter 200mm, 300mm
Accuracy ±1 µm
Resolution 0.1µm
Thickness range 100 - 750 µm
Automatic wafer geometry gauge yes
Software MXNT