E+H
Automatable geometry gauge for thin and standard 200mm or 300mm silicon wafers.
Measurement type
。Thickness
。Flatness (TTV)
。Bow
。Warp
Wafer Diameter | 200mm, 300mm |
Accuracy | ±1 µm |
Resolution | 0.1µm |
Thickness range | 100 - 750 µm |
Automatic wafer geometry gauge | yes |
Software | MXNT |